학술논문

Spurious Features Everywhere - Large-Scale Detection of Harmful Spurious Features in ImageNet
Document Type
Conference
Source
2023 IEEE/CVF International Conference on Computer Vision (ICCV) ICCV Computer Vision (ICCV), 2023 IEEE/CVF International Conference on. :20178-20189 Oct, 2023
Subject
Computing and Processing
Signal Processing and Analysis
Deep learning
Computer vision
Toy manufacturing industry
Data visualization
Training data
Predictive models
Feature extraction
Language
ISSN
2380-7504
Abstract
Benchmark performance of deep learning classifiers alone is not a reliable predictor for the performance of a deployed model. In particular, if the image classifier has picked up spurious features in the training data, its predictions can fail in unexpected ways. In this paper, we develop a framework that allows us to systematically identify spurious features in large datasets like ImageNet. It is based on our neural PCA components and their visualization. Previous work on spurious features often operates in toy settings or requires costly pixel-wise annotations. In contrast, we work with ImageNet and validate our results by showing that presence of the harmful spurious feature of a class alone is sufficient to trigger the prediction of that class. We introduce the novel dataset "Spurious ImageNet" which allows to measure the reliance of any ImageNet classifier on harmful spurious features. Moreover, we introduce SpuFix as a simple mitigation method to reduce the dependence of any ImageNet classifier on previously identified harmful spurious features without requiring additional labels or retraining of the model. We provide code and data at https://github.com/YanNeu/spurious_imagenet.