학술논문
Hub-centered production control of wafer fabrication
Document Type
Conference
Author
Source
IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop Advanced Semiconductor Manufacturing Conference and Workshop, 1990. ASMC 90 Proceedings. IEEE/SEMI 1990. :27-32 1990
Subject
Language
Abstract
A flow-rate control policy to manage the production of a wafer fabrication facility is described. The policy is derived by formulating and solving a stochastic control problem. The results are then used to develop two sets of production control rules. The first one adjusts the lot release by determining when and how many new lots should be started. The second one controls the reentrant process in the photolithography area, commonly known as the hub. The control rules are robust against random disturbances because they provide a feedback control based on the information of the entire shop floor.ETX