학술논문
Enhancing reliability of a strong physical unclonable function (PUF) solution based on virgin-state phase change memory (PCM)
Document Type
Conference
Author
Source
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
Subject
Language
ISSN
1938-1891
Abstract
In the era of the internet of things (IoT), hardware physical unclonable functions (PUFs) have become an essential feature for authentication of any system on chip (SoC). Identifying physical entropy sources is essential for developing low-cost, low-power, highly reliable PUFs. This work presents a new PUF circuit based on embedded PCM, called MVPUF. The new PUF relies on the random virgin state of the PCM combined with a new selection technique of challenge-response pairs (CRPs), thus showing better reliability compared to PUFs based on resistive switching memory (RRAM).