학술논문
High resolution X-ray imaging using a silicon strip detector
Document Type
Conference
Author
Source
1997 IEEE Nuclear Science Symposium Conference Record Nuclear science Nuclear Science Symposium, 1997. IEEE. 2:1269-1273 vol.2 1997
Subject
Language
ISSN
1082-3654
Abstract
The authors present the first images and an initial evaluation of a scanned-slot X-ray imaging system based on edge-on silicon strip detectors and high-speed low-noise parallel processing ASICs. The authors have demonstrated noiseless single photon counting above a minimal threshold of 7.2 keV. Edge scans show negligible cross talk between different channels in the ASIC. The Modulation Transfer Function (MTF) has been measured and found to agree with the ideal MTF for 100 /spl mu/m pixel size. The first images are obtained at very low exposures and show the high performance of the system. The authors also present a way of enhancing the X-ray flux to a slot by using a refractive X-ray lens. They believe this focusing device will significantly enhance the potential for scanned-slot X-ray imaging.