학술논문

The Damage Analysis for Irradiation Tolerant Spin-Driven Thermoelectric Device Based on Single-Crystalline Y₃Fe₅O₁₂/Pt Heterostructures
Document Type
Periodical
Source
IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 58(8):1-6 Aug, 2022
Subject
Fields, Waves and Electromagnetics
Radiation effects
Semiconductor device measurement
Gold
Transmission electron microscopy
Magnetization
Thermocouples
Ions
Ion radiation effects
radiation hardening (electronics)
spintronics
thermoelectricity
Language
ISSN
0018-9464
1941-0069
Abstract
Spin-driven thermoelectric (STE) generation based on the combination of the spin Seebeck effect (SSE) and inverse spin Hall effect is an alternative to conventional semiconductor-based thermocouples as it is large scale, low cost, and environment-friendly. The STE device is thought to be radiation hard, making it attractive for space and nuclear technology applications. By using magnetometry, transmission electron microscopy, and the hard X-ray photoemission spectroscopy (HAXPES) measurements, we show that an STE device made of single-crystalline Y 3 Fe 5 O 12 (YIG)/Pt heterostructures has tolerance to irradiation of high-energy heavy ion beams. We used 200 MeV gold ion beams modeling cumulative damages due to fission products emitted from the surface of spent nuclear fuels. By varying the dose level, we confirmed that the thermoelectric and magnetic properties of the single-crystalline YIG/Pt STE device are finite at the ion-irradiation dose up to 10 12 ions/cm 2 fluence. In addition, the HAXPES measurements were performed to understand the effects at the interface of YIG/Pt. The HAXPES data suggest that the chemical reaction regarding Fe and O that diminishes the SSE signals is promoted with the increase of the irradiation dose. The understandings of the damage analysis in YIG/Pt are beneficial for developing better STE devices applicable to harsh environmental usages.