학술논문

Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification
Document Type
Periodical
Source
IEEE Access Access, IEEE. 11:22418-22429 2023
Subject
Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Geoscience
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Production facilities
Tomography
Fading channels
Receivers
Attenuation
OFDM
Bayes methods
Factory environment
LOS/NLOS identification
radio tomographic imaging
Language
ISSN
2169-3536
Abstract
Radio tomographic imaging (RTI) is a technique for estimating spatial loss fields (SLFs), which maps the quantified attenuation of radio signals at every spatial location within monitored regions. In this study, we investigate RTI techniques in indoor factory environments, where the RTI techniques deteriorate because of severe multipath channels. We propose the binary radio tomographic imaging (binary RTI) method, where the attenuation level of each pixel in a SLF is defined as a binary value. The binary RTI method is suited for factory environments, including metallic objects, because radio signals are almost fully reflected rather than getting absorbed by such objects. In the proposed method, we suppose that transmitted signals are modulated with an orthogonal frequency division multiplexing (OFDM) format, and each receiver is equipped with multiple antenna elements. By adopting the two-dimensional multiple signal classification (MUSIC), the proposed method identifies whether the signals are transmitted in a line-of-sight (LOS) or a non-line-of-sight (NLOS) path. From the LOS/NLOS identification, we propose two algorithms to estimate the binary SLF: a simple greedy algorithm and a relaxation algorithm with low-rank approximation. We evaluate the performance of the proposed method via simulation experiments. To assess the applicability of the proposed method to factory environments, we assume a severe multipath environment where all the objects, wall, and ceiling are perfect electrical conductors, and show that by using an appropriate threshold parameter for the LOS/NLOS identification, the proposed method can estimate the binary SLF in the test environment.