학술논문

SRAMs SEL and SEU in-flight data from PROBA-II spacecraft

Document Type

Conference

Author

D'Alessio, M.; Poivey, C.; Ferlet-Cavrois, V.; Evans, H.; Harboe-Sorensen, R.; Keating, A.; Lopez-Calle, I.; Guerre, F. X.; Lochon, F.; Santandrea, S.; Zadeh, A.; Muschitiello, M.; Markgraf, M.; Montenbruck, O.; Grillenberger, A.; Fleurinck, N.; Puimege, K.; Gerrits, D.; Matthijs, P.

Source

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on. :1-8 Sep, 2013

Subject

Components, Circuits, Devices and Systems
Photonics and Electrooptics
Time division multiplexing
Random access memory
Global Positioning System
Monitoring
Temperature sensors
Protons
Temperature measurement
Single Event Effect (SEE)
Single Event Upset (SEU)
Single Event Latch-up (SEL)
radiation experiment
radiation monitor
Static Random Access Memory (SRAM)
technology demonstration
hardness assurance

Language

Abstract

This paper presents an analysis of the SEE in-flight data of SRAMs on board Proba-II spacecraft. Proba-II spacecraft has been flying on a LEO orbit for more than 3 years. Observed in-flight error rates are compared with predictions based on ground test data.

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