부산대학교 도서관

The present article presents a methodology for measuring the loss of yield of photovoltaic solar cells due to degradation and to dirty in large scale photovoltaic solar systems. The study allows, in a practical and simplified way, the entrepreneur can measure the loss of power due to these phenomena prior to the installation of the plant. The applied methodology consists of the analysis of the behavior of the open circuit voltage and the short-circuit current, comparing the properties of the voltage and current curve measured with those of the standard test condition, for the environment to which the photovoltaic cell will be exposed.