학술논문

Modelling recrystallizaton in oligocrystalline SnAgCu solder joint under cyclic loading condition
Document Type
Conference
Source
2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024 25th International Conference on. :1-6 Apr, 2024
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Photonics and Electrooptics
Power, Energy and Industry Applications
Grain boundaries
Micromechanical devices
Creep
Loading
Morphology
Metals
Anisotropic
SAC305
oligocrystalline joint
grain boundary
recrystallization
Voronoi tessellation
anisotropic creep response
Language
ISSN
2833-8596
Abstract
Grain morphology of SnAgCu (SAC) solder alloys is known to evolve throughout their life due to recrystallization caused by mechanical and/or thermal cycling. Changes in grain morphology affect the overall anisotropic mechanical behavior of few-grained (oligocrystalline) SAC solder joints. The recrystallization occurs preferentially and locally in high deformation regions in solder joints, resulting in the formation of small grains and new grain boundaries. This behavior has been studied experimentally by different researchers and various attempts have been made to model the recrystallization in solder joints under different cycling conditions. The objectives of this article are to: (i) demonstrate a procedure for explicit modeling of recrystallization in critical regions of anisotropic oligocrystalline solder joints, using multi-level nested Voronoi tessellation techniques; and (ii) demonstrate the effects of the recrystallization on solder joint creep response, using anisotropic Hill-Garofalo representation of each grain and an isotropic Mises-Garofalo representation of the intervening grain boundaries.