학술논문

Magnetic recording properties onto nano-imprinted patterned media
Document Type
Conference
Source
INTERMAG 2006 - IEEE International Magnetics Conference Magnetics Conference, 2006. INTERMAG 2006. IEEE International. :564-564 May, 2006
Subject
Fields, Waves and Electromagnetics
Magnetic recording
Magnetic properties
Magnetic anisotropy
Perpendicular magnetic anisotropy
Magnetic domains
Signal to noise ratio
Costs
Lithography
Resists
Sputter etching
Language
ISSN
2150-4598
2150-4601
Abstract
Nanoimprint is a promising technique, which allows the replication of nano-objects on a large surface by a low cost and simple process. A Si mould was prepared on an 8 inch diameter wafer by high-resolution e-beam lithography. The reverse image of the pattern was obtained by imprinting a resist at a force of 15 kN. This image is subsequently transferred in Si by reactive ion etching (RIE). The magnetic layers have been deposited by magnetron sputtering after nano-imprint and RIE. Both Co/Pt multilayers and CoPtCrTa exhibit a high out-of-plane anisotropy and the magnetic dots as deposited are single domain and exchange decoupled. The recording performances on the pre-patterned structures have been studied with a quasi-static tester using a high-resolution (~1nm) piezoelectric positioning stage and commercial magnetoresistive (MR) write/read heads. The signal to noise ratio (SNR) has been calculated with respect to the BL.