부산대학교 도서관

Growing reverse-engineering attempts to steal or violate a design intellectual property (IP), or to identify the device technology in order to counterfeit integrated circuits (ICs), raise serious concerns in the IC design community. As the information derived from these practices can be used in a number of malicious ways, various active techniques have been proposed and deployed to protect IP, of which logic locking is a vital part. It allows inserting certain gates in a circuit’s data path to lock outputs to fixed logic values, if a wrong unlocking key is applied. This paper demonstrates that test points—industry-proven design-for-test technology used primarily to enhance the overall design testability–can also be reused in the mission mode to lock the circuit, and thus to improve the hardware security against IP piracy. In particular, it is shown that test points can facilitate the hiding of design functionality from adversaries. As a result, not only is the overall design testability improved, but also effective protection against piracy through unauthorized excess production and other forms of IP theft is ensured. Experimental results on industrial designs with test points demonstrate that the proposed scheme is effective in achieving a desired degree of hardware obfuscation.