학술논문

Self-Curable Synaptor With Tri-Node Charge- Trap FinFET for Semi-Supervised Learning
Document Type
Periodical
Source
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(4):716-719 Apr, 2024
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Training
Logic gates
FinFETs
Tunneling
Labeling
Heating systems
Artificial neural networks
Artificial synapse
charge-trap FinFET
electro-thermal annealing
pseudo labeling
self-curing
semi-supervised learning
synaptor
Language
ISSN
0741-3106
1558-0563
Abstract
Semi-supervised learning (SSL) with pseudo-labeling is applied to the non-volatile computing-in-memory (nvCIM) architecture through weight updates of a synaptic transistor (synaptor). The synaptor is a tri-node FinFET enclosing a charge-trap layer. For on-chip training over extended periods, self-curing induced by electrothermal annealing (ETA) is utilized to raise the tunneling oxide temperature of the synaptor until it exceeds 500 °C. As a result, a classification accuracy of 86.4% is achieved by training only 1,000 labeled datasets with self-curing operations. This accuracy level is comparable to that of supervised learning (SL) with 10,000 labeled training datasets. Not only the MNIST but also the CIFAR-10 dataset was verified whether it yields similar results when using SSL.