학술논문

First Demonstration of True 4-bit Memory with Record High Multibit Retention >103s and Read Window >105 by Hydrogen Self-Adaptive-Doping for IGZO DRAM Arrays
Document Type
Conference
Source
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Subject
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Hydrogen
Random access memory
Doping
Ions
Stability analysis
Windows
Thermal stability
Language
ISSN
2156-017X
Abstract
For the first time, we demonstrate a true 4-bit memory with a large operation margin, as well as record-long multibit retention with the largest read window in IGZO-based 2T0C DRAM. It is enabled by a low-cost oxygen-compensated hydrogen self-adaptive-doping (OHAD) method with a new theory of H self-adaptive-doping. Due to the controllable compensation for defects and enhanced source/drain doping by the OHAD method, the reduced channel carrier scattering and contact resistance are both achieved. The best-in-class devices exhibit the V TH modulated to +0.23 V and the I on boosted to 35 μA/μm, along with the smallest performance variation of σ(V TH ) = 25 mV and σ/μ(I on ) = 4%. It yields a record-high memory window >10 5 and ultra-long retention of 10 4 s with the largest margin, capable of the first 16-level separated current memory states for realizing a true 4-bit 2T0C DRAM cell with record-long 1000-s retention time in multibit operation.