학술논문
Active probes for 2-port network analysis within 70-230 GHz
Document Type
Conference
Source
1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282) Microwave symposium Microwave Symposium Digest, 1999 IEEE MTT-S International. 4:1635-1638 vol.4 1999
Subject
Language
Abstract
Active probes for 2-port on-wafer network analysis within 70-230 GHz are presented. The probe contains an integrated circuit, based on nonlinear transmission lines (NLTL), which has all elements of an S-parameter test set. 2-port measurements with these active probes were carried out. Compared to earlier active probe systems, measurement accuracy is greatly improved.