학술논문

Transparent IGZO-Based Logic Gates
Document Type
Periodical
Source
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(5):673-675 May, 2012
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Logic gates
Transistors
Inverters
Substrates
Capacitance
Indium
Optical device fabrication
Indium–gallium–zinc–oxide (IGZO)
logic gate
nand gate
nor gate
thin-film transistors (TFTs)
transparent circuits
Language
ISSN
0741-3106
1558-0563
Abstract
Optically transparent indium–gallium–zinc–oxide-based nand and nor gates and inverters were fabricated and characterized using transistors deposited at room temperature with 5-, 10-, and 20-$\mu \hbox{m}$ gate lengths and beta ratio between 2.5 and 40. The nand and nor gates' operation frequencies were measured up to 5 kHz. The individual transistors were measured to have saturation mobility of 14 $ \hbox{cm}^{2}/\hbox{V} \cdot \hbox{s}$, subthreshold swing of 190 mV/dec, and current on/off ratios in excess of $\hbox{10}^{8}$. Logic operations were satisfactorily demonstrated for bias voltage between 1 and 20 V. These results indicate that viable digital logic can be applied particularly where optical transparency or the use of novel flexible substrates is more important than the operating speeds.