학술논문

Modeling Process and Device Behavior of Josephson Junctions in Superconductor Electronics With TCAD
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(11):5448-5454 Nov, 2021
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Object oriented modeling
Mathematical model
Oxidation
Computational modeling
Tools
Semiconductor device modeling
Metals
Device technology computer-aided design (TCAD)
Josephson junction (JJ)
process TCAD
superconductor electronics (SCE)
Language
ISSN
0018-9383
1557-9646
Abstract
We report the development of a process/device simulation platform to model superconductor electronics. The process simulator leverages the back-end modeling capabilities of Florida object-oriented process/device/reliability simulator (FLOOXS) and builds on the existing models to simulate processes specific to Josephson junction (JJ) fabrication. The device simulator uses the process generated models and computes the normal-state electrical properties of a Nb/Al-AlO/Nb JJ. It is used to predict key operational figures of merit and how they vary with changes in process models. By integrating the process and device simulation tools, this research aims to offer an environment for the simulation of JJ circuits.