학술논문

Biocompatibility assessment of advanced wafer-level based chip encapsulation
Document Type
Conference
Source
3rd Electronics System Integration Technology Conference ESTC Electronic System-Integration Technology Conference (ESTC), 2010 3rd. :1-4 Sep, 2010
Subject
Components, Circuits, Devices and Systems
Communication, Networking and Broadcast Technologies
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Pollution measurement
Atomic measurements
Biology
Cardiology
Copper
Biosensors
CMOS integrated circuits
Language
Abstract
Next generation implantable microsystem-based medical devices will have different packaging requirements than current implantable devices such as pace makers. While the packaging must remain biocompatible and provide a bi-directional diffusion barrier, it must also permit the biosensors, microelectrodes, etc to intimately interact with the extracellular environment. A CMOS compatible wafer level packaging strategy for die encapsulation has been developed and tested. TXRF measurements of 3T3 culture medium used in elution testing at physiological temperatures indicate the stack of PECVD diffusion barriers (SiC, SiN, SiO 2 ) are effective in limiting Cu from leaching from the device. Additionally live-dead cell assays on in vitro co-cultures with both 3T3 fibroblasts and neonatal rat cardiomyocytes demonstrate the effectiveness of the different diffusion barrier stacks in preventing cytotoxic conditions.