학술논문

Optimal Gate Commutated Thyristor Design for Bi-Mode Gate Commutated Thyristors Underpinning High, Temperature Independent, Current Controllability
Document Type
Periodical
Source
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 39(9):1342-1345 Sep, 2018
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Anodes
Cathodes
Junctions
Logic gates
Thyristors
Current density
Failure analysis
Full wafer modeling
reverse conducting
gate commutated thyristor
maximum controllable current
MCC
Language
ISSN
0741-3106
1558-0563
Abstract
The bi-mode gate commutated thyristor (GCT) is an advanced reverse conducting device aiming high-power applications. Due to the high degree of interdigitation of diode parts and GCT parts, it is necessary to investigate how to best separate the two and at the same time, how to maximize the individual power handling capability. This work underpins the latter, for the GCT part. In achieving that, this letter details the optimization direction, identifies the design parameters that influence the maximum controllable current (MCC), and thereafter introduces a new design attribute, the “p-zone.” This new design not only improves the MCC at high temperature but also at low temperature, yielding temperature independent current handling capability and at least 1000 A, or 23.5% of improvement compared to the state-of-the-art. As a result, the proposed design constitutes an enabler for optimally designed bi-mode devices rated at least 5000 A for applications with the highest power requirement.