학술논문

Rigorous Model-Based Mask Data Preparation Algorithm Applied to Grayscale Lithography for the Patterning at the Micrometer Scale
Document Type
Periodical
Source
Journal of Microelectromechanical Systems J. Microelectromech. Syst. Microelectromechanical Systems, Journal of. 30(3):442-455 Jun, 2021
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Resists
Gray-scale
Lithography
Optical imaging
Lighting
Optical diffraction
Mathematical model
Grayscale lithography
microfabrication
data-preparation
optimization
Python
Language
ISSN
1057-7157
1941-0158
Abstract
Grayscale mask creation has for the most part been restricted to over-simplified optical and resist models usually based on a contrast curve approach. While this technique has proven to work for microstructures of large dimensions (ten to hundreds of micrometers), its capability has not been assessed for microstructures with smaller dimensions. In this paper, a rigorous lithographic model has been developed in Python to simulate the process of imaging, exposure and development of an i-line photoresist. Using this model, a mask data preparation algorithm capable of optimizing simultaneously both the size and position of the dots on a grayscale mask has been implemented. Experimental results after development of the photoresist confirm the capability of our mask data preparation algorithm to achieve microstructures with dimensions ranging between 1 to $3~\mu \text{m}$ . [2021-0018]