학술논문

Role of Doping and Thickness of Emitter in the Efficiency of Monocrystalline Si Solar Cells
Document Type
Conference
Source
2007 Spanish Conference on Electron Devices Electron Devices, 2007 Spanish Conference on. :254-257 Jan, 2007
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Doping
Photovoltaic cells
Radiative recombination
Measurement standards
Software standards
Loss measurement
Software measurement
Lighting
Electrical resistance measurement
Furnaces
Photovoltaic cell fabrication
Silicon
Solar energy
Spectral analysis
Language
ISSN
2163-4971
Abstract
In order to improve the efficiency of Czocharalski - Si (Cz-Si) photovoltaic cells, we have studied the distribution losses from recombination in Cz-Si commercial standard cell (Isofoton S.A.) by means of I-V measurements under solar simulation illumination with a surface irradiance of 1000 W/m 2 and a light spectrum corresponding to a relative air mass of 1.5 G and the PC-1D software. The quantum efficiency of these cells was also measured. An important ratio of losses is localized in the emitters with a low resistance (40 Ω/ ). To decrease the Auger recombination in these emitters we have changed the phosphorous diffusion condition in the furnace in order to obtain shallower and low doping emitters (80 Ω/ ). A new paste for fingers and a metallization procedure were also developing. These new cells present an improvement in its efficiency of 3.5%.