학술논문

Sectional meander microstrip delay line: interconnection modelling
Document Type
Conference
Source
2015 Open Conference of Electrical, Electronic and Information Sciences (eStream) Electrical, Electronic and Information Sciences (eStream), 2015 Open Conference of. :1-5 Apr, 2015
Subject
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Fields, Waves and Electromagnetics
General Topics for Engineers
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Delays
Frequency measurement
Phase measurement
Capacitance
Load modeling
Resonant frequency
Scattering
meander microstrip delay line
meander sections
phase delay versus frequency
resonance measurement technique
Language
Abstract
Model of sectional meander microstrip delay line (MMDL), which takes into account the mismatch and heterogeneity of sections, is created. Multiple sections are widely used in the planar delay lines (DL) to optimize filling the substrate area by signal conductor; for example, to achieve desired large delay, several substrates with multiple sections may be assembled and connected. Several models of the sectional DL are discussed in this paper. According to the "simplified" model a section of the transmission line (TL) is connected to the load of different impedances. This section corresponds to the single MMDL meander segment. Such model does not take into account scattering of electric field at the DL edges, and frequency dependency of characteristic impedance and phase delay of TL section. The "intermediate" models in reality are only modified the “simplified” model. To evaluate electric field scattering at the MMDL ends lumped capacitors are used in these models. Nevertheless, the frequency dependence of impedance and phase delay remains unevaluated in the "intermediate" model. The "final" model is based on hybrid analysis technique – synergy of method of moments and scattering matrixes. This model takes into account both the electric field scattering and inconsistency of sections.