학술논문
A new vertical JFET technology for the powering scheme of the ATLAS upgrade inner tracker
Document Type
Conference
Author
Source
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), 2016. :1-4 Oct, 2016
Subject
Language
Abstract
The IMB-CNM (Barcelona) has developed a new vertical JFET (V-JFET) technology with the purpose of working as rad-hard switches in the HV powering scheme of the upgraded ATLAS tracker. The design of the new transistors draws upon a deep-trenched 3D technology to achieve vertical conduction and low switch-off voltage. These features prospect suitable radiation hardness for the application. The first V-JFET prototypes are now fabricated and characterized, with very promising results already meeting the application requirements. A compilation of the simulated and measured performance is shown in the contribution. To evaluate the radiation hardness, gamma irradiation has been performed and the main results are presented here.