학술논문

Hydrogenated amorphous silicon germanium films doped with nitrogen (a-SiGe:H,N) to improve the long-wave infrared (LWIR) region absorption
Document Type
Conference
Source
2022 IEEE Latin American Electron Devices Conference (LAEDC) Electron Devices Conference (LAEDC), 2022 IEEE Latin American. :1-4 Jul, 2022
Subject
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Photonics and Electrooptics
Power, Energy and Industry Applications
Signal Processing and Analysis
Night vision
Absorption
Films
Plasma measurements
Sensors
Nitrogen
Security
Silicon
Germanium
LWIR
PECVD
microbolometer
Language
Abstract
Sensors in the long-wave IR region are used due to their enormous importance in technology for a variety of applications, as medical diagnostics, fire protection, automotive night vision, security and military, among others. This paper reports our study of hydrogenated amorphous silicon-germanium (a-SiGe:H) thin films deposited by low-frequency plasma-enhanced chemical vapor deposition (LF-PECVD), in order to be used as long-wave infrared (LWIR) sensing films in microbolometers. In order to improve the absorbance of the IR sensing films, they were doped with nitrogen (N 2 ) using different flow rates. FTIR measurements were performed to compare the absorption coefficient of the films doped with different N 2 flow rates, where was observed that effectively, the absorption in the 8 – 14 μm spectral range was improved for the films deposited with larger N 2 flow rates. Also, it was observed that the incorporation of N 2 in the a-SiGe:H films improves the room temperature conductivity (σ RT ) up to 3 orders of magnitude.