학술논문

A 67–116-GHz Cryogenic Low-Noise Amplifier in a 50-nm InGaAs Metamorphic HEMT Technology
Document Type
Periodical
Source
IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 32(5):430-433 May, 2022
Subject
Fields, Waves and Electromagnetics
Communication, Networking and Broadcast Technologies
Signal Processing and Analysis
Cryogenics
mHEMTs
MODFETs
Logic gates
Indium phosphide
III-V semiconductor materials
Temperature distribution
Cryogenic
high-electron-mobility transistors (HEMTs)
low-noise amplifiers (LNAs)
metamorphic HEMTs (mHEMTs)
millimeter wave (mmW)
monolithic microwave integrated circuits (MMICs)
noise
radio astronomy
W<%2Fitalic>-band%22">W-band
Language
ISSN
1531-1309
1558-1764
Abstract
This letter presents a 67–116-GHz low-noise amplifier (LNA) module with state-of-the-art cryogenic noise performance. The LNA is based on a monolithic microwave integrated circuit (MMIC) that is fabricated in a 50-nm metamorphic high-electron-mobility transistor (mHEMT) technology. The MMIC is packaged in a WR10 waveguide split-block housing and uses fused silica ${E}$ -plane microstrip-to-waveguide transitions. For a 67–116-GHz bandwidth, the amplifier exhibits average noise temperatures ( ${T}~_{{\text {e}}}$ ) at 15 and 300 K of 21.4 and 194 K, respectively. A minimum ${T}~_{{\text {e}}}$ of 13.6 K is achieved at 72.2 GHz. To the best of the authors’ knowledge, this LNA demonstrates a new low-noise benchmark for room temperature and cryogenic noise temperatures in the extended ${W}$ -band frequency range.