학술논문

Modeling of Organic Metal–Insulator– Semiconductor Capacitor
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(9):3967-3972 Sep, 2019
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Capacitors
Capacitance
Semiconductor device modeling
Mathematical model
Logic gates
Insulators
Metals
Device simulation
organic metal–insulator–semiconductor (MIS) capacitor
Schottky contacts
surface potential
Language
ISSN
0018-9383
1557-9646
Abstract
In this paper, we present the operation principle of an organic metal–insulator–semiconductor (MIS) capacitor where the organic semiconductor is undoped. In spite of a low charge concentration within the semiconductor, this device exhibits a capacitance variation with respect to the applied gate voltage yielding the capacitance–voltage characteristics similar to that of a traditional MIS capacitor based on the doped semiconductor. A physics-based model is developed to derive the charge concentration, surface potential, and the capacitance of the organic MIS capacitor. The model is validated with TCAD simulation results as well as with experimental data obtained from the fabricated organic MIS capacitor consisting of poly(4-vinylphenol) and poly(3-hexylthiophene-2, 5-diyl) as an insulator and a semiconductor, respectively.