학술논문
PVT Compensation for Wilkinson Single-Slope Measurement Systems
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 59(5):2444-2450 Oct, 2012
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5- $\mu$m Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC.