학술논문

Physical Insight Into Multiple Gate-Voltage Dependencies of Off-State Photocurrent in Amorphous InZnO Thin-Film Transistors
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):2243-2246 Mar, 2024
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photoconductivity
Lighting
Ionization
Thin film transistors
Steady-state
Logic gates
Absorption
Amorphous InZnO (a-IZO)
dynamic response
oxygen vacancy
photocurrent
thin-film transistors (TFTs)
Language
ISSN
0018-9383
1557-9646
Abstract
The multiple gate-voltage ( ${V}_{\text {g}}$ ) dependencies of the OFF-state photocurrent ( ${I}_{\mathrm {ph-{\scriptscriptstyle OFF}}}$ ) with increasing, decreasing, or being constant are observed in amorphous InZnO (a-IZO) thin-film transistors (TFTs) during reverse sweeps of ${V}_{\text {g}}$ from high to low values. This study provides a physical insight into the multiple ${V}_{\text {g}}$ dependencies by considering the joint effects of ${V}_{\text {g}}$ and the dynamic ionization of oxygen vacancy ( ${V}_{\text {O}}$ ) on the source-to-channel barrier that ultimately determines ${I}_{\mathrm {ph-{\scriptscriptstyle OFF}}}$ . When the photo-induced ionization of ${V}_{\text {O}}$ reaches a steady state during the reverse ${V}_{\text {g}}$ sweep, ${I}_{\mathrm {ph-{\scriptscriptstyle OFF}}}$ is primarily dominated by ${V}_{\text {g}}$ , resulting in a decreasing ${I}_{\mathrm {ph-{\scriptscriptstyle OFF}}}$ with ${V}_{\text {g}}$ . When the ionization of ${V}_{\text {O}}$ is far from reaching a steady state, ${I}_{\mathrm {ph-{\scriptscriptstyle OFF}}}$ is mainly affected by the increasing ${V}_{\text {O}}$ ionization, ${I}_{\mathrm {ph-{\scriptscriptstyle OFF}}}$ leading to an increasing with ${V}_{\text {g}}$ . An intermediate state exists, where the effects of ${V}_{\text {O}}^{{2}+}$ are comparable, resulting in an almost constant ${I}_{\mathrm {ph-{\scriptscriptstyle OFF}}}$ . The proposed mechanism is verified by experimentally measured results.