부산대학교 도서관

A general and flexible approach is presented for predicting far-field radiated emissions from a device using phaseless magnetic near-field scan data, which is based on the replacement of the actual radiating sources by an equivalent set of electric currents over a planar surface near the device. These equivalent currents used to predict the far-field radiated emissions are determined from near-field scan data by solving two independent nonlinear inverse problems with a global optimization algorithm. Numerical examples are presented to demonstrate the validity and capability of the presented approach.