학술논문

A Zero-Shot Soft Sensor Modeling Approach Using Adversarial Learning for Robustness Against Sensor Fault
Document Type
Periodical
Source
IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 19(4):5891-5901 Apr, 2023
Subject
Power, Energy and Industry Applications
Signal Processing and Analysis
Computing and Processing
Communication, Networking and Broadcast Technologies
Soft sensors
Robustness
Training
Data models
Deep learning
Adversarial machine learning
Informatics
Adversarial learning
deep learning
robust soft sensor
sensor fault
zero-shot learning
Language
ISSN
1551-3203
1941-0050
Abstract
Soft sensors are widely used in many industrial systems to monitor key variables that are difficult to measure, using measurements from other available physical sensors. Because physical sensors are susceptible to faults, it is crucial for soft sensor models to be robust against them. Recently, deep learning has shown promising results in developing data-driven soft sensors for various applications. However, existing learning-based soft sensors are still vulnerable to sensor faults, which could deteriorate the performance of the models. In this article, we propose a deep learning-based modeling framework for developing soft sensor models that are robust to sensor faults. Due to the difficulty in obtaining datasets that cover all possible sensor fault characteristics, the proposed framework is developed to be zero-shot such that the model can be trained with only fault-free dataset without requiring any sensor fault patterns, thus greatly saving the time and resources needed to collect such data. Instead, adversarial examples are used as a proxy for faulty sensor inputs so that the model can learn to be adaptive through the proposed two-stage, uncertainty-aware recurrent neural network architecture. We demonstrate our approach to the TE benchmark process and a real industrial multiphase flow process and show that robustness is achieved as the accuracy does not degrade significantly when sensor faults are present during the model evaluation.