학술논문
An update to applications of open standards to test automation to board-level testing
Document Type
Conference
Source
Proceedings of AUTOTESTCON '94 AUTOTESTCON '94 AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.. :43-48 1994
Subject
Language
Abstract
An application of open standard formats to board-level test was described in a paper presented at AUTOTESTCON 1993. This paper provides an update to this work, including descriptions of the problems encountered and solutions developed in applying such standards to two specific printed circuit boards and two automatic test systems (ATSs): the GenRad 2751 and a Modular Automatic Test Equipment (MATE) compatible system. A complete test automation flow process developed around these open standards and data formats is described, including the specific software tools developed, and the input and output requirements of each tool.ETX