학술논문

Processing waveguide photonic components into self-assembled organic films
Document Type
Conference
Source
2009 14th OptoElectronics and Communications Conference OptoElectronics and Communications Conference, 2009. OECC 2009. 14th. :1-2 Jul, 2009
Subject
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Photonics and Electrooptics
Waveguide components
Slabs
Optical films
Optical waveguides
Milling
Rough surfaces
Surface roughness
Atomic measurements
Force measurement
Atomic force microscopy
Language
ISSN
2166-8884
2166-8892
Abstract
A focused ion beam (FIB) is used to process 2-D self-assembled photonic porphyrin film flats to fabricate couplers in 2-D porphyrin slabs. These self-assembled structures have an initial root mean squared (rms) values for surface roughness ≪ 0.5 nm as measured by atomic force microscopy. Under appropriate FIB processing and cutting conditions, the rms value for surface roughness falls to ≪ 0.4 nm.