학술논문
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
Document Type
Conference
Author
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Reorda, M. Sonza; Sterpone, L.; Tancorre, V.; Ugioli, R.
Source
2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-10 May, 2022
Subject
Language
ISSN
1558-1780
Abstract
This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.