학술논문

All-Silicon Photodetectors for Photonic Integrated Circuit Calibration
Document Type
Periodical
Source
IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 33(16):836-839 Aug, 2021
Subject
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Optical waveguides
Photonics
Silicon
Current measurement
Optical device fabrication
Optical variables measurement
Optical imaging
Photonic integrated circuits
integrated photodetectors
phase errors
photonic circuit calibration
photon-assisted tunneling
Language
ISSN
1041-1135
1941-0174
Abstract
All-silicon highly-doped PN junction-based photodetectors, for photonic integrated circuit (PIC) calibration and power monitoring, are designed and fabricated in the C-band. The photodetector response is measured for different doping conditions. The photodetectors are integrated with an interferometric based phase-interrogator structure for a test calibration circuit. The measured devices show high responsivity (12 A/W) obtained under avalanche condition at 5.7 V reverse bias and reasonable dark current ( $1~\mu \text{A}$ ) due to photon assisted tunneling effect and are therefore, proved to be an ideal candidate for power monitoring and phase calibration of PICs.