학술논문

SMILETRAP-a wide-range high-precision mass spectrometer
Document Type
Periodical
Source
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 44(2):553-557 Apr, 1995
Subject
Power, Energy and Industry Applications
Components, Circuits, Devices and Systems
Mass spectroscopy
Argon
Electron traps
Cyclotrons
Frequency
Electron beams
Ion sources
Current measurement
Charge measurement
Nuclear measurements
Language
ISSN
0018-9456
1557-9662
Abstract
The capture of externally produced highly charged ions in a Penning trap and the observation of their cyclotron frequencies is described. The ions were produced in an electron beam ion source at a 2.8 kV potential. Injection was made possible by a pretrap, in which these ions were first captured at 2.8 kV and then lowered down to ground potential which allowed transfer (at 1 kV) and capture in the measurement trap at 0 V, The first mass comparisons were made between different charge states of the same nuclei, that is, O/sup 8+//O/sup 7+/, Ar/sup 14+//Ar/sup 13+/,and Ar/sup 17+//Ar/sup 16+/. Comparison s between different nuclei, Ar/sup 13+,14+,15+,16+//H/sub 2//sup 2+/, were also made. First tests of accuracy indicates uncertainties smaller than 10/sup -8/.ETX