학술논문

High energy resolution CdTe Schottky diode γ-ray detectors
Document Type
Conference
Source
2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE. :4156-4164 Oct, 2012
Subject
Bioengineering
Signal Processing and Analysis
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Language
ISSN
1082-3654
Abstract
Schottky diode X/γ-ray detectors based on semi-insulating Cl-doped CdTe crystals have been developed and investigated. Both the Schottky and Ohmic contacts were formed by vacuum deposition of Ni electrodes on the opposite faces of (111) oriented CdTe crystals pre-treated by Ar ion bombardment with different parameters. Record-low leakage current in the fabricated Ni/CdTe/Ni structure at high voltages (∼5 nA at 300 K for the area of 10 mm 2 at bias voltage of 1500 V) was achieved that was caused by the charge transport mechanisms which were interpreted on the basis of known theoretical models. The developed detectors have shown the record-high energy resolution in the measurements of the spectra of 137 Cs and 57 Co isotopes (FWHM of 0.42% and 0.49%, respectively). From a comparison of the spectra taken with the detector irradiated from the Schottky contact side and from the opposite side with an Ohmic contact, the concentration of uncompensated impurities (defects) in the CdTe crystals has been determined. The obtained value has been found to be close to the optimal one.