학술논문

Effects of stoichiometry in undoped CdTe heteroepilayers on Si
Document Type
Conference
Source
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd. :1-5 Jun, 2015
Subject
Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Power, Energy and Industry Applications
II-VI semiconductor materials
Cadmium compounds
Silicon
Molecular beam epitaxial growth
Substrates
Semiconductor process modeling
cadmium telluride
characterization
heteroepilayers
photovoltaic device
silicon
stoichiometry
Language
Abstract
Crystalline CdTe layers have been grown heteroepitaxially onto crystalline Si substrates to establish material parameters needed for advanced photovoltaic (PV) device development and related simulation. These studies suggest that additional availability of the intrinsic anion (i.e., Te) during molecular beam epitaxy deposition can improve structural and optoelectronic quality of the epilayer and the interface between Si substrate and the epilayer. This is seen most notably for thin CdTe epitaxial films (< ∼10 µm). Although these observations are foundationally important, they are also relevant to envisioned high-performance multijunction II–VI alloy PV devices—where thin layers will be required to achieve production costs aligned with market constraints.