학술논문
Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers
Document Type
Conference
Author
Source
2011 37th IEEE Photovoltaic Specialists Conference Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE. :001647-001651 Jun, 2011
Subject
Language
ISSN
0160-8371
Abstract
We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.