학술논문

A Comparison of Terahertz Permittivity Measurements of Several Dielectric Materials Using Frequency and Time Domain Methods
Document Type
Conference
Source
2021 97th ARFTG Microwave Measurement Conference (ARFTG) ARFTG Microwave Measurement Conference (ARFTG), 2021 97th. :1-4 Jun, 2021
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
General Topics for Engineers
Microwave measurement
Time-frequency analysis
Permittivity measurement
Reflection
Loss measurement
Time measurement
Laminates
Time Domain Spectrometer
Vector Network Analyzer
dielectric material characterization
dielectric measurements
parameter extraction
THz
complex permittivity
dielectric constant
loss tangent
nondestructive testing
free space
laminates
PTFE
epoxy glass
thermoset resin
Language
Abstract
Frequency and time domain methods for extracting the complex permittivity of laminates at THz frequencies are compared. Materials are characterized with free space systems that incorporate the Vector Network Analyzer with frequency extenders, and a Time Domain Spectrometer system. Data resolution, polarization anomalies, amplitude oscillations, frequency range, accuracy, and parameter extraction methodology (including reflections) are presented and compared. Both methods are advantageous with good agreement existing between the data.