학술논문
Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems
Document Type
Conference
Author
Source
2016 88th ARFTG Microwave Measurement Conference (ARFTG) Microwave Measurement Conference (ARFTG), 2016 88th ARFTG. :1-4 Dec, 2016
Subject
Language
Abstract
In this study, quasi-optical techniques are used to evaluate the properties of dielectric substrates at millimeter wave frequencies. Anisotropy with respect to wave polarization was observed in the composite materials using several instruments including the FTS, TDS, and THz VNA. The measurements were carried out from 200 GHz to 3000 GHz (3 THz ) depending on the instrument. Material loss deviated significantly above 500 GHz. Uniform plastics such as H/LDPE polyethylene were well behaved by comparison.