학술논문

Initialization of sequential circuits and its application to ATPG
Document Type
Conference
Source
Proceedings of 14th VLSI Test Symposium VLSI test VLSI Test Symposium, 1996., Proceedings of 14th. :246-251 1996
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Computing and Processing
Signal Processing and Analysis
Sequential circuits
Automatic test pattern generation
Circuit simulation
Circuit faults
Multivalued logic
Flip-flops
Equations
Silicon
Graphics
Hardware
Language
ISSN
1093-0167
Abstract
A general method for determining whether a certain design is initializable, and for generating its initialization sequence, is presented in this paper. This method is based on structural decomposition of the circuit, and can handle both logical (using X-value simulation) and functional initializability. The routines developed are then used for ATPG of sequential circuits.