학술논문

P6H-1 Electrochemical Etching of Quartz
Document Type
Conference
Source
2007 IEEE Ultrasonics Symposium Proceedings Ultrasonics Symposium, 2007. IEEE. :2586-2589 Oct, 2007
Subject
Signal Processing and Analysis
Fields, Waves and Electromagnetics
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Etching
Crystallization
Micromachining
Silicon
Insulation
Charge carriers
Chemicals
Electrons
Density measurement
Current measurement
Language
ISSN
1051-0117
Abstract
We present the first results on the electrochemical etching of crystalline quartz. Used for bulk micromachining of silicon, electrochemical etching has not been previously explored as a method for processing quartz because of its insulating nature. By injecting energetic charge carriers into the quartz it can be made temporarily conductive, allowing current to be passed through in magnitudes which will affect the chemical etch rate. This was experimentally verified by etching samples of AT-cut quartz while bombarding the sample with electrons. Etch depths were measured and plotted as a function of current density, showing a variation of +/-3X the control etch rate. The ability to increase and decrease the etch rate can be used to define novel quartz microstructures.