학술논문

Electronic and optical properties of vanadium doped silicon carbide crystals grown by the sublimation sandwich method
Document Type
Conference
Source
Proceedings of Semiconducting and Semi-Insulating Materials Conference Semiconducting and insulating materials Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE. :219-222 1996
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Silicon carbide
Crystals
Luminescence
Charge carrier lifetime
Impurities
Photoluminescence
Dielectric substrates
Dielectric losses
Conductivity
Crystallization
Language
Abstract
Cathodoluminescence-mapping experiments of n- and p-type 6H SiC intentionally doped with vanadium (V) show a local anti-correlation of the V/sup 4+/ related IR-luminescence and the near bandedge donor-acceptor pair luminescence (N/spl rarr/Al). This fact indicates, that V acts as minority carrier lifetime determining impurity. The suppression of the V/sup 4+/ luminescence near crystallographic defects is discussed under the possible mechanism of V precipitate formation. The binding-energy of the V/sup 4+/5+/ donor level is determined to E/sub v/+1.57/spl plusmn/0.05 eV by photoluminescence excitation measurements.