학술논문
A simple method for on-wafer antenna gain measurement
Document Type
Conference
Author
Source
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS) Progress In Electromagnetics Research Symposium - Spring (PIERS) , 2017. :1620-1624 May, 2017
Subject
Language
Abstract
This paper presents a simple on-wafer antenna gain and radiation pattern measurement method in the probe station environment. It needs only the antenna under test (AUT) itself, a vector network analyzer, and a metal strip for the measurement procedure. The measurement and simulation gain results at E-band match very well in the resonance frequency band, with a difference less than 1 dB.