학술논문

Computer Vision on X-Ray Data in Industrial Production and Security Applications: A Comprehensive Survey
Document Type
Periodical
Source
IEEE Access Access, IEEE. 11:2445-2477 2023
Subject
Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Geoscience
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
X-ray imaging
Security
Computer vision
Imaging
Industrial engineering
Three-dimensional displays
Deep learning
deep learning
X-ray
industrial applications
security applications
Language
ISSN
2169-3536
Abstract
X-ray imaging technology has been used for decades in clinical tasks to reveal the internal condition of different organs, and in recent years, it has become more common in other areas such as industry, security, and geography. The recent development of computer vision and machine learning techniques has also made it easier to automatically process X-ray images and several machine learning-based object (anomaly) detection, classification, and segmentation methods have been recently employed in X-ray image analysis. Due to the high potential of deep learning in related image processing applications, it has been used in most of the studies. This survey reviews the recent research on using computer vision and machine learning for X-ray analysis in industrial production and security applications and covers the applications, techniques, evaluation metrics, datasets, and performance comparison of those techniques on publicly available datasets. We also highlight some drawbacks in the published research and give recommendations for future research in computer vision-based X-ray analysis.