학술논문

PROBA-II Technology Demonstration Module In-Flight Data Analysis
Document Type
Periodical
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 59(4):1086-1091 Aug, 2012
Subject
Nuclear Engineering
Bioengineering
Time division multiplexing
Protons
Monitoring
Temperature sensors
Temperature distribution
Temperature measurement
Orbits
Hardness assurance
radiation experiment
radiation monitor
SEU/SEL
single event effects
SRAMs
technology demonstration
Language
ISSN
0018-9499
1558-1578
Abstract
A Technology Demonstration Module (TDM) to monitor radiation effects in semiconductor devices was part of the payload on-board the European Space Agency (ESA) PROBA-II satellite. PROBA-II was launched on November 2nd 2009, into an 800 km polar orbit with the TDM switched-on since February 15th 2010. The TDM primarily carries modern memory devices in order to monitor and record their Single Event Effect (SEE) behavior in respect to orbital positions. This paper presents a first set of in-flight data obtained between February 15th 2010 and March 31st 2011. Emphases were placed on validation of the various experiments and not on data analysis itself. Observed in-flight error rates are compared with predictions based on ground test data obtained on flight lot devices operating under identical conditions.