학술논문
Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
Document Type
Periodical
Author
Alia, R.G.; Tali, M.; Brugger, M.; Cecchetto, M.; Cerutti, F.; Cononetti, A.; Danzeca, S.; Esposito, L.; Fernandez-Martinez, P.; Gilardoni, S.; Infantino, A.; Kastriotou, M.; Kerboub, N.; Lerner, G.; Wyrwoll, V.; Ferlet-Cavrois, V.; Boatella, C.; Javanainen, A.; Kettunen, H.; Morilla, Y.; Martin-Holgado, P.; Gaillard, R.; Wrobel, F.; Cazzaniga, C.; Alexandrescu, D.; Glorieux, M.; Puchner, H.
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(1):345-352 Jan, 2020
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ~0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.