학술논문
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
Document Type
Conference
Author
Source
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on. :1-4 Sep, 2015
Subject
Language
Abstract
A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.