학술논문

AC Performance of Polysilicon Leaky-Mode MSM Photodetectors
Document Type
Periodical
Source
Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 28(18):2724-2729 Sep, 2010
Subject
Communication, Networking and Broadcast Technologies
Photonics and Electrooptics
Photodetectors
Detectors
CMOS process
Photoconductivity
Optical waveguides
Photoconducting materials
Pulse measurements
Schottky barriers
Contacts
Integrated circuit measurements
Complementary metal-oxide-semiconductor (CMOS)-compatible optoelectronic integrated circuit
leaky-mode metal-semiconductor-metal photodetectors
optical interconnect
photoconductivity
Language
ISSN
0733-8724
1558-2213
Abstract
Pulse response of polysilicon metal-semiconductor-metal (MSM) photodetectors fabricated in a standard CMOS processes is described, including demonstration of pulse full-width at half-max (FWHM) of 1.32 ns. Pulse FWHM as low as 0.81 ns has been measured, as have 10%–90% rise times of 0.39 ns. Measured detector performance is limited by laser diode modulation capabilities. An analytic expression for the time domain response in the presence of body and contact recombination is reported.