부산대학교 도서관

Dynamic test compaction techniques are used during test generation to ensure that each test detects as many faults as possible, resulting in the smallest possible number of tests. As additional tests are generated, detected faults are removed from consideration, and it is expected that the number of detected faults per test would decrease. A nonmonotonic decrease in this parameter indicates that the test set may be larger than necessary since tests detect fewer faults than possible. To ensure a monotonic decrease, this article suggests a dynamic test compaction technique that inserts every new test into the test set at a position based on the number of faults it detects. After inserting a test, the procedure adjusts the test and all the tests that follow it to detect more faults. Experimental results to demonstrate the effectiveness of test insertion as a dynamic test compaction technique are presented for single-cycle gate-exhaustive faults in benchmark circuits. The large number of faults brings out the ability of test insertion to contribute to test compaction.