부산대학교 도서관

Iterative synthesis consists of local design modifications to improve design parameters or correct design errors. Incremental test generation was suggested for evaluating the effects of the modifications on the testability of the design. This brief suggests that a fast (incomplete) procedure for identifying undetectable faults is effective in identifying that the testability will deteriorate because of a local design modification without performing test generation. Two experiments are carried out using a procedure that performs successive local design modifications. A modification is accepted only if it does not result in new undetectable faults, and other modifications are eliminated. The results for single stuck-at faults in benchmark circuits demonstrate that fast identification of undetectable faults is typically sufficient for preventing the fault coverage from decreasing because of the modifications.